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Details van artikel 56 van 87 gevonden artikelen
| Titel: |
Reliability of semiconductor and gas-filled diodes for over-voltage protection exposed to ionizing radiation |
| Auteur: |
Stanković Koviljka Vujisić Miloš Dolićanin Edin |
| Verschenen in: |
Nuclear technology & radiation protection |
| Paginering: | Jaargang 24 (2009) nr. 2 pagina's 132-137 |
| Jaar: |
2009 |
| Inhoud: |
The wide-spread use of semiconductor and gas-filled diodes for non-linear over-voltage protection results in a variety of possible working conditions. It is therefore essential to have a thorough insight into their reliability in exploitation environments which imply exposure to ionizing radiation. The aim of this paper is to investigate the influence of irradiation on over-voltage diode characteristics by exposing the diodes to californium-252 combined neutron/gamma radiation field. The irradiation of semiconductor over-voltage diodes causes severe degradation of their protection characteristics. On the other hand, gas-filled over-voltage diodes exhibit a temporal improvement of performance. The results are presented with the accompanying theoretical interpretations of the observed changes in over-voltage diode behaviour, based on the interaction of radiation with materials constituting the diodes. |
| Uitgever: |
VINČA Institute of Nuclear Sciences (provided by DOAJ) |
| Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
Details van artikel 56 van 87 gevonden artikelen
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