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  High-deposition-rate growth of PZT thin films by reactive electron beam coevaporation using Ti/Zr alloy
 
 
Titel: High-deposition-rate growth of PZT thin films by reactive electron beam coevaporation using Ti/Zr alloy
Auteur: Mochizuki, Shoichi
Mihara, Toshiyuki
Ishida, Tadashi
Verschenen in: Integrated ferroelectrics
Paginering: Jaargang 12 (1996) nr. 2-4 pagina's 125-130
Jaar: 1996-10-01
Inhoud: Lead zirconate titanate (PZT) thin films were prepared by coevaporation of titanium/zirconium alloy and lead metal with an electron beam gun. Each of evaporation rates was independently controlled by each quartz crystal thickness monitor. Titanium/zirconium alloy was used because of simplicity of chemical composition control. To promote oxidation of the films, a mixed gas of oxygen and ozone (5%) was used. When evaporation rates of titanium/zirconium alloy and lead metal were controlled moderately, perovskite phase PZT film was obtained on 50 nm-thick-PbTiO3-film at substrate temperature of 550°C. When atomic ratio of titanium/zirconium alloy was 50:50, chemical composition of the films was Ti:Zr = 9:1. Deposition rate was greater than 50 nm/min, which was much larger than that by the sputtering method.
Uitgever: Taylor & Francis
Bronbestand: Elektronische Wetenschappelijke Tijdschriften
 
 

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