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Journal description
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Details for article 16 of 31 found articles
| Title: |
Measurement of Adhesion Force by a Symmetric AFM Probe for Nano-imprint Lithography Application |
| Author: |
Lee, Hee-Jung Hyun, Seungmin Kim, Jae-Hyun Lee, Hak-Joo Choi, Dae-Geun Lee, Dong-II Jeong, Jun-Ho Lee, Eung-Sug |
| Appeared in: |
Journal of adhesion science and technology |
| Paging: | Volume 22 (2008) nr. 13 pages 1379-1386 |
| Year: |
2008-09-01 |
| Contents: | |
| Publisher: |
Brill, Leiden/Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 31 found articles
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