Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges
Titel:
Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges
Auteur:
Etzelstorfer, Tanja Süess, Martin J. Schiefler, Gustav L. Jacques, Vincent L. R. Carbone, Dina Chrastina, Daniel Isella, Giovanni Spolenak, Ralph Stangl, Julian Sigg, Hans Diaz, Ana
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 21 (2014) nr. 1 pagina's 111-118
Jaar:
2014-01-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England