Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges
Title:
Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges
Author:
Etzelstorfer, Tanja Süess, Martin J. Schiefler, Gustav L. Jacques, Vincent L. R. Carbone, Dina Chrastina, Daniel Isella, Giovanni Spolenak, Ralph Stangl, Julian Sigg, Hans Diaz, Ana
Appeared in:
Journal of synchrotron radiation
Paging:
Volume 21 (2014) nr. 1 pages 111-118
Year:
2014-01-01
Contents:
Publisher:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England