High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry
Titel:
High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry
Auteur:
Rosenthal, Martin Doblas, David Hernandez, Jaime J. Odarchenko, Yaroslav I. Burghammer, Manfred Di Cola, Emanuela Spitzer, Denis Antipov, A. E. Aldoshin, L. S. Ivanov, Dimitri A.
Verschenen in:
Journal of synchrotron radiation
Paginering:
Jaargang 21 (2014) nr. 1 pagina's 223-228
Jaar:
2014-01-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England