High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry
Title:
High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry
Author:
Rosenthal, Martin Doblas, David Hernandez, Jaime J. Odarchenko, Yaroslav I. Burghammer, Manfred Di Cola, Emanuela Spitzer, Denis Antipov, A. E. Aldoshin, L. S. Ivanov, Dimitri A.
Appeared in:
Journal of synchrotron radiation
Paging:
Volume 21 (2014) nr. 1 pages 223-228
Year:
2014-01-01
Contents:
Publisher:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England