D+: software for high-resolution hierarchical modeling of solution X-ray scattering from complex structures
Titel:
D+: software for high-resolution hierarchical modeling of solution X-ray scattering from complex structures
Auteur:
Ginsburg, Avi Ben-Nun, Tal Asor, Roi Shemesh, Asaf Fink, Lea Tekoah, Roee Levartovsky, Yehonatan Khaykelson, Daniel Dharan, Raviv Fellig, Amos Raviv, Uri
Verschenen in:
Journal of applied crystallography
Paginering:
Jaargang 52 (2019) nr. 1 pagina's 219-242
Jaar:
2019-02-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England