D+: software for high-resolution hierarchical modeling of solution X-ray scattering from complex structures
Title:
D+: software for high-resolution hierarchical modeling of solution X-ray scattering from complex structures
Author:
Ginsburg, Avi Ben-Nun, Tal Asor, Roi Shemesh, Asaf Fink, Lea Tekoah, Roee Levartovsky, Yehonatan Khaykelson, Daniel Dharan, Raviv Fellig, Amos Raviv, Uri
Appeared in:
Journal of applied crystallography
Paging:
Volume 52 (2019) nr. 1 pages 219-242
Year:
2019-02-01
Contents:
Publisher:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England