A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction
Titel:
A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction
Auteur:
Marciszko, Marianna Baczmański, Andrzej Klaus, Manuela Genzel, Christoph Oponowicz, Adrian Wroński, Sebastian Wróbel, Mirosław Braham, Chedly Sidhom, Habib Wawszczak, Roman
Verschenen in:
Journal of applied crystallography
Paginering:
Jaargang 51 (2018) nr. 3 pagina's 732-745
Jaar:
2018-06-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England