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Details for article 2 of 47 found articles
| Title: |
A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction |
| Author: |
Marciszko, Marianna Baczmański, Andrzej Klaus, Manuela Genzel, Christoph Oponowicz, Adrian Wroński, Sebastian Wróbel, Mirosław Braham, Chedly Sidhom, Habib Wawszczak, Roman |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 51 (2018) nr. 3 pages 732-745 |
| Year: |
2018-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 47 found articles
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