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Details for article 7 of 46 found articles
| Title: |
Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging |
| Author: |
Tsoutsouva, M. G. Oliveira, V. A. Baruchel, J. Camel, D. Marie, B. Lafford, T. A. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 48 (2015) nr. 3 pages 645-654 |
| Year: |
2015-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 46 found articles
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