Aging-time-resolved in situ microstructural investigation of tin films electroplated on copper substrates, applying two-dimensional-detector X-ray diffraction
Titel:
Aging-time-resolved in situ microstructural investigation of tin films electroplated on copper substrates, applying two-dimensional-detector X-ray diffraction
Auteur:
Stein, Jendrik Welzel, Udo Huegel, Werner Blatt, Sabine Mittemeijer, Eric Jan
Verschenen in:
Journal of applied crystallography
Paginering:
Jaargang 46 (2013) nr. 6 pagina's 1645-1653
Jaar:
2013-02-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England