|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 2 of 48 found articles
| Title: |
Aging-time-resolved in situ microstructural investigation of tin films electroplated on copper substrates, applying two-dimensional-detector X-ray diffraction |
| Author: |
Stein, Jendrik Welzel, Udo Huegel, Werner Blatt, Sabine Mittemeijer, Eric Jan |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 46 (2013) nr. 6 pages 1645-1653 |
| Year: |
2013-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 48 found articles
| << previous | next >> |