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Determining the C60 molecular arrangement in thin films by means of X-ray diffraction |
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Titel: |
Determining the C60 molecular arrangement in thin films by means of X-ray diffraction |
Auteur: |
Elschner, Chris Levin, Alexandr A. Wilde, Lutz Grenzer, Jörg Schroer, Christian Leo, Karl Riede, Moritz |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 44 (2011) nr. 5 pagina's 983-990 |
Jaar: |
2011-00-01 |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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