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Details for article 9 of 31 found articles
| Title: |
Determining the C60 molecular arrangement in thin films by means of X-ray diffraction |
| Author: |
Elschner, Chris Levin, Alexandr A. Wilde, Lutz Grenzer, Jörg Schroer, Christian Leo, Karl Riede, Moritz |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 44 (2011) nr. 5 pages 983-990 |
| Year: |
2011-00-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 31 found articles
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