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Journal description
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Details for article 31 of 33 found articles
| Title: |
X-ray diffraction at constant penetration depth – a viable approach for characterizing steep residual stress gradients |
| Author: |
Erbacher, Thomas Wanner, Alexander Beck, Tilmann Vöhringer, Otmar |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 41 (2008) nr. 2 pages 377-385 |
| Year: |
2008-04-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 31 of 33 found articles
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