Structural analysis of thin films of novel polynorbornene derivatives by grazing incidence X-ray scattering and specular X-ray reflectivity along with ellipsometry
Titel:
Structural analysis of thin films of novel polynorbornene derivatives by grazing incidence X-ray scattering and specular X-ray reflectivity along with ellipsometry
Auteur:
Lee, Taek Joon Byun, Gwang-su Jin, Kyeong Sik Heo, Kyuyoung Kim, Gahee Kim, Sang Youl Cho, Iwhan Ree, Moonhor
Verschenen in:
Journal of applied crystallography
Paginering:
Jaargang 40 (2007) nr. s1 pagina's s620-s625
Jaar:
2007-04-01
Inhoud:
Uitgever:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England