Structural analysis of thin films of novel polynorbornene derivatives by grazing incidence X-ray scattering and specular X-ray reflectivity along with ellipsometry
Title:
Structural analysis of thin films of novel polynorbornene derivatives by grazing incidence X-ray scattering and specular X-ray reflectivity along with ellipsometry
Author:
Lee, Taek Joon Byun, Gwang-su Jin, Kyeong Sik Heo, Kyuyoung Kim, Gahee Kim, Sang Youl Cho, Iwhan Ree, Moonhor
Appeared in:
Journal of applied crystallography
Paging:
Volume 40 (2007) nr. s1 pages s620-s625
Year:
2007-04-01
Contents:
Publisher:
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England