|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 20 of 24 found articles
| Title: |
Thin-film disorientation measurement using the single-crystal Nonius Kappa CCD diffractometer |
| Author: |
Aubert, Emmanuel Wenger, Emmanuel Link, Mathias Assouar, Badreddine Didierjean, Claude Lecomte, Claude |
| Appeared in: |
Applied crystallography online |
| Paging: | Volume 39 (2006) nr. 6 pages 919-921 |
| Year: |
2006-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 20 of 24 found articles
| << previous | next >> |