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Details for article 19 of 24 found articles
| Title: |
Thin film analysis by X-ray scattering. By Mario Birkholz, with contributions by P. F. Fewster and C. Genzel. Pp. xxii+356. Weinheim: Wiley-VCH Verlag GmbH Co., 2005. Price (hardcover) EUR 119, SFR 188. ISBN-10: 3-527-31052-5; ISBN-13: 978-3-527-31052-4. |
| Author: |
Chateigner, Daniel |
| Appeared in: |
Applied crystallography online |
| Paging: | Volume 39 (2006) nr. 6 pages 925-926 |
| Year: |
2006-02-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 24 found articles
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