|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 33 of 34 found articles
| Title: |
Thick-mode resonance of a PZT/Si wafer stack investigated by X-ray diffraction in Bragg geometry |
| Author: |
de Souza, Paulo Eduardo Narcizo Cusatis, César Saul, Cyro Ketzer Rodrigues, Antônio Ricardo Drohler de Camargo, Paulo César |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 36 (2003) nr. 5 pages 1144-1147 |
| Year: |
2003-00-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 33 of 34 found articles
| << previous | next >> |