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Characterization of Hexagonal and Lamellar Mesoporous Silicas, Aluminosilicates and Gallosilicates by Small-Angle X-ray Scattering |
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Titel: |
Characterization of Hexagonal and Lamellar Mesoporous Silicas, Aluminosilicates and Gallosilicates by Small-Angle X-ray Scattering |
Auteur: |
Van den Bossche, G. Sobry, R. Fontaine, F. Clacens, J.-M. Gabelica, Z. |
Verschenen in: |
Journal of applied crystallography |
Paginering: |
Jaargang 30 (1997) nr. 6 pagina's 1065-1074 |
Jaar: |
1997-02-01 |
Inhoud: |
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Uitgever: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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