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Characterization of Hexagonal and Lamellar Mesoporous Silicas, Aluminosilicates and Gallosilicates by Small-Angle X-ray Scattering |
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Title: |
Characterization of Hexagonal and Lamellar Mesoporous Silicas, Aluminosilicates and Gallosilicates by Small-Angle X-ray Scattering |
Author: |
Van den Bossche, G. Sobry, R. Fontaine, F. Clacens, J.-M. Gabelica, Z. |
Appeared in: |
Journal of applied crystallography |
Paging: |
Volume 30 (1997) nr. 6 pages 1065-1074 |
Year: |
1997-02-01 |
Contents: |
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Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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