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                                       Details for article 19 of 24 found articles
 
 
  Quantitive analysis of Laue diffraction patterns recorded with a 120 ps exposure from an X-ray undulator
 
 
Title: Quantitive analysis of Laue diffraction patterns recorded with a 120 ps exposure from an X-ray undulator
Author: Szebenyi, D. M. E.
Bilderback, D. H.
LeGrand, A.
Moffat, K.
Schildkamp, W.
Smith Temple, B.
Teng, T.
Appeared in: Journal of applied crystallography
Paging: Volume 25 (1992) nr. 3 pages 414-423
Year: 1992-06-01
Contents:
Publisher: International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 19 of 24 found articles
 
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