|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 18 of 24 found articles
| Title: |
Precise X-ray relative measurement of lattice parameters of silicon wafers by multiple-crystal Bragg-case diffractometry. Computer simulation of the experiment |
| Author: |
Cembali, F. Fabbri, R. Servidori, M. Zani, A. Basile, G. Cavagnero, G. Bergamin, A. Zosi, G. |
| Appeared in: |
Journal of applied crystallography |
| Paging: | Volume 25 (1992) nr. 3 pages 424-431 |
| Year: |
1992-06-01 |
| Contents: | |
| Publisher: |
International Union of Crystallography, 5 Abbey Square, Chester, Cheshire CH1 2HU, England |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 24 found articles
| << previous | next >> |