|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 48 of 61 found articles
| Title: |
X-ray diffraction peak profiles from heteroepitaxial structures with misfit dislocations |
| Author: |
Kaganer, V. M. Opitz, R. Schmidbauer, M. Köhler, R. Jenichen, B. |
| Appeared in: |
Il nuovo cimento. D |
| Paging: | Volume 19 (1997) nr. 2-4 pages 285-292 |
| Year: |
1997 |
| Contents: | |
| Publisher: |
Società Italiana di Fisica, Bologna |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 48 of 61 found articles
| << previous | next >> |