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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
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Details for article 2 of 17 found articles
| Title: |
Characterizing and monitoring thin-film processes with spectroscopic ellipsometry |
| Author: |
Srivatsa, Arun R. Ygartua, Carlos L. |
| Appeared in: |
JOM |
| Paging: | Volume 51 (1999) nr. 3 pages 34-36 |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Springer-Verlag, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 17 found articles
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