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Journal description
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Details for article 11 of 19 found articles
| Title: |
Laser Induced Stress Wave Thermometry for In-situ Temperature and Thickness Characterization of Single Crystalline Silicon Wafer: Part I—Theory and Apparatus |
| Author: |
Vedantham, V. Suh, C. S. Chona, R. |
| Appeared in: |
Experimental mechanics |
| Paging: | Volume 51 (2010) nr. 7 pages 1103-1114 |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 19 found articles
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