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                                       Details for article 3 of 12 found articles
 
 
  Electromechanical Characterization of Au Thin Films using Micro-tensile Testing
 
 
Title: Electromechanical Characterization of Au Thin Films using Micro-tensile Testing
Author: Lee, S. J.
Park, J. M.
Han, S. W.
Hyun, S. M.
Kim, J. H.
Lee, H. J.
Appeared in: Experimental mechanics
Paging: Volume 50 (2009) nr. 5 pages 643-649
Year: 2009
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 12 found articles
 
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