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Journal description
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Details for article 3 of 12 found articles
| Title: |
Electromechanical Characterization of Au Thin Films using Micro-tensile Testing |
| Author: |
Lee, S. J. Park, J. M. Han, S. W. Hyun, S. M. Kim, J. H. Lee, H. J. |
| Appeared in: |
Experimental mechanics |
| Paging: | Volume 50 (2009) nr. 5 pages 643-649 |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 12 found articles
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