Analysis of deep level defects in nitrogen post-deposition annealed Ga2O3/SiC hetero-structured Schottky diodes grown by mist-CVD
Titel:
Analysis of deep level defects in nitrogen post-deposition annealed Ga2O3/SiC hetero-structured Schottky diodes grown by mist-CVD
Auteur:
Lee, Tae-Hee Park, Se-Rim Choi, Ji-Soo Chung, Seung-Hwan Kim, Min-Yeong Lee, Geon-Hee Cho, Seong-Ho Bae, Si-Young Kim, Il Ryong Kim, Min Kyu Lim, Byeong Cheol Schweitz, Michael A. Koo, Sang-Mo
Verschenen in:
Applied physics. Part A, Materials science and processing