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Details for article 1 of 101 found articles
| Title: |
Analysis of deep level defects in nitrogen post-deposition annealed Ga2O3/SiC hetero-structured Schottky diodes grown by mist-CVD |
| Author: |
Lee, Tae-Hee Park, Se-Rim Choi, Ji-Soo Chung, Seung-Hwan Kim, Min-Yeong Lee, Geon-Hee Cho, Seong-Ho Bae, Si-Young Kim, Il Ryong Kim, Min Kyu Lim, Byeong Cheol Schweitz, Michael A. Koo, Sang-Mo |
| Appeared in: |
Applied physics. Part A, Materials science and processing |
| Paging: | Volume 130 () nr. 10 pages xx |
| Year: |
2024-09-10 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 101 found articles
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