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Journal description
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Details for article 8 of 19 found articles
| Title: |
Effect of Lattice Defects on the Electromigration-Induced Instability of the Interface between Joined Conductive Materials |
| Author: |
Makhviladze, T. M. Sarychev, M. E. |
| Appeared in: |
Russian microelectronics |
| Paging: | Volume 51 () nr. 6 pages 426-434 |
| Year: |
2022-12-23 |
| Contents: | |
| Publisher: |
Pleiades Publishing, Moscow |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 19 found articles
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