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Journal description
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Details for article 6 of 18 found articles
| Title: |
Improvements in the Quasi-static Capacitance–Voltage Characterization of Semiconductor–Insulator Interface States (Si/SiO2) |
| Author: |
Gulyaev, I. B. Zhdan, A. G. Kukharskaya, N. F. Tikhonov, R. D. Chucheva, G. V. |
| Appeared in: |
Russian microelectronics |
| Paging: | Volume 33 (2004) nr. 4 pages 224-235 |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers-Plenum Publishers, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 18 found articles
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