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                                       Details for article 2 of 20 found articles
 
 
  Carrier Trapping and Scattering in Ge-Doped SiO2
 
 
Title: Carrier Trapping and Scattering in Ge-Doped SiO2
Author: Brinkevich, D. I.
Prosolovich, V. S.
Yankovskii, Yu. N.
Appeared in: Russian microelectronics
Paging: Volume 31 (2002) nr. 4 pages 254-256
Year: 2002
Contents:
Publisher: Kluwer Academic Publishers-Plenum Publishers, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 20 found articles
 
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