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Details for article 6 of 38 found articles
| Title: |
Analytical Investigation of the Influence of the Structural Parameters of the Optoelectronic Path of a Thermal-Imaging Device on Its Characteristics |
| Author: |
Krutikov, V. N. |
| Appeared in: |
Measurement techniques |
| Paging: | Volume 46 (2003) nr. 2 pages 128-135 |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers-Plenum Publishers, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 38 found articles
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