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Journal description
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Details for article 5 of 38 found articles
| Title: |
Analytical Investigation of the Influence of the Structural Parameters of the Optoelectronic Path of a Thermal-Imaging Device on Its Characteristics |
| Author: |
V. N. Krutikov |
| Appeared in: |
Measurement techniques |
| Paging: | Volume 46 (2003) nr. 2 pages 8 p. |
| Year: |
2003-02 |
| Contents: | |
| Publisher: |
Kluwer Academic/Plenum Publishers, New York, U.S.A. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 38 found articles
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