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Journal description
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Details for article 14 of 33 found articles
| Title: |
Electrical characterization of deep levels in N and P 6H-SiC Schottky diodes |
| Author: |
Sghaier, N. Souifi, A. K. Bluet, J. M. Guillot, G. |
| Appeared in: |
Journal of materials science. Materials in electronics |
| Paging: | Volume 12 (2001) nr. 4-6 pages 273-276 |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 33 found articles
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