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Journal description
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Details for article 9 of 10 found articles
| Title: |
Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding |
| Author: |
Yuan, Haiying Mei, Jiaping Song, Hongying Guo, Kun |
| Appeared in: |
Journal of electronic testing |
| Paging: | Volume 30 (2014) nr. 2 pages 237-242 |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 10 found articles
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