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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 29 of 30 found articles
| Title: |
Using At-Speed BIST to Test LVDS Serializer/Deserializer Function |
| Author: |
Magnus Eckersand Fredrik Franzon Ken Filliter |
| Appeared in: |
Journal of electronic testing |
| Paging: | Volume 18 (2002) nr. 2 pages 7 p. |
| Year: |
2002-04 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers, Boston, U.S.A |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 29 of 30 found articles
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