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Details for article 5 of 39 found articles
| Title: |
An analysis of interface trap charges to improve the reliability of a charge-plasma-based nanotube tunnel FET |
| Author: |
Gedam, Anju Acharya, Bibhudendra Mishra, Guru Prasad |
| Appeared in: |
Journal of computational electronics |
| Paging: | Volume 20 () nr. 3 pages 1157-1168 |
| Year: |
2021-04-08 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 39 found articles
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