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                                       Details for article 4 of 39 found articles
 
 
  Analytical estimation of breakdown voltage in insulated-gate bipolar transistors
 
 
Title: Analytical estimation of breakdown voltage in insulated-gate bipolar transistors
Author: Zhu, Chen
Andrei, Petru
Appeared in: Journal of computational electronics
Paging: Volume 20 () nr. 3 pages 1202-1208
Year: 2021-05-28
Contents:
Publisher: Springer US, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 39 found articles
 
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