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Design impact on three gate Dynamic Flash Memory (3G_DFM) for long hole retention time and robust disturbance shield |
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Titel: |
Design impact on three gate Dynamic Flash Memory (3G_DFM) for long hole retention time and robust disturbance shield |
Auteur: |
Sakui, Koji Li, Yisuo Kakumu, Masakazu Kanazawa, Kenichi Kunishima, Iwao Iwata, Yoshihisa Harada, Nozomu |
Verschenen in: |
Memories, materials, devices, circuits and systems |
Paginering: |
Jaargang 4 () nr. C pagina's p. |
Jaar: |
2023 |
Inhoud: |
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Uitgever: |
The Author(s) |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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