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Rapid detection of capture and emission processes in surface and buffer traps: Understanding dynamic degradation in GaN power devices |
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Titel: |
Rapid detection of capture and emission processes in surface and buffer traps: Understanding dynamic degradation in GaN power devices |
Auteur: |
Yao, Yixu Huang, Sen Jiang, Qimeng Wang, Xinhua Huang, Yifei Pei, Yi Qian, Hongtu Zhang, Hui Guo, Fuqiang Shen, Bo Liu, Xinyu |
Verschenen in: |
Power electronic devices and components |
Paginering: |
Jaargang 8 () nr. C pagina's p. |
Jaar: |
2024 |
Inhoud: |
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Uitgever: |
The Authors |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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