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Journal description
All volumes of the corresponding journal
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Details for article 7 of 7 found articles
| Title: |
Rapid detection of capture and emission processes in surface and buffer traps: Understanding dynamic degradation in GaN power devices |
| Author: |
Yao, Yixu Huang, Sen Jiang, Qimeng Wang, Xinhua Huang, Yifei Pei, Yi Qian, Hongtu Zhang, Hui Guo, Fuqiang Shen, Bo Liu, Xinyu |
| Appeared in: |
Power electronic devices and components |
| Paging: | Volume 8 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 7 found articles
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