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Projecting GaN HEMTs lifetimes under typical stresses commonly observed in DC-DC converters |
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Titel: |
Projecting GaN HEMTs lifetimes under typical stresses commonly observed in DC-DC converters |
Auteur: |
Zhang, Shengke Gajare, Siddhesh Garcia, Ricardo Huang, Sijun Espinoza, Angel Gorgerino, Andrea Zhang, Ruizhe Pozo, Alejandro Strittmatter, Robert Lidow, Alex |
Verschenen in: |
Power electronic devices and components |
Paginering: |
Jaargang 6 () nr. C pagina's p. |
Jaar: |
2023 |
Inhoud: |
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Uitgever: |
Efficient Power Conversion Corporation |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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