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Projecting GaN HEMTs lifetimes under typical stresses commonly observed in DC-DC converters |
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Title: |
Projecting GaN HEMTs lifetimes under typical stresses commonly observed in DC-DC converters |
Author: |
Zhang, Shengke Gajare, Siddhesh Garcia, Ricardo Huang, Sijun Espinoza, Angel Gorgerino, Andrea Zhang, Ruizhe Pozo, Alejandro Strittmatter, Robert Lidow, Alex |
Appeared in: |
Power electronic devices and components |
Paging: |
Volume 6 () nr. C pages p. |
Year: |
2023 |
Contents: |
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Publisher: |
Efficient Power Conversion Corporation |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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