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Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy |
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Titel: |
Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy |
Auteur: |
Sakurai, Hiroshi Suzuki, Kosuke Ishii, Shoya Hoshi, Kazushi Nozawa, Takashi Ozaki, Hidetsugu Haga, Hiroto Tanigawa, Hiroyasu Someya, Yoji Tsuchiya, Masao Takeuchi, Hiroshi Tsuji, Naruki |
Verschenen in: |
Nuclear materials and energy |
Paginering: |
Jaargang 31 () nr. C pagina's p. |
Jaar: |
2022 |
Inhoud: |
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Uitgever: |
The Authors |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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