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                                       Details for article 10 of 41 found articles
 
 
  Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy
 
 
Title: Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy
Author: Sakurai, Hiroshi
Suzuki, Kosuke
Ishii, Shoya
Hoshi, Kazushi
Nozawa, Takashi
Ozaki, Hidetsugu
Haga, Hiroto
Tanigawa, Hiroyasu
Someya, Yoji
Tsuchiya, Masao
Takeuchi, Hiroshi
Tsuji, Naruki
Appeared in: Nuclear materials and energy
Paging: Volume 31 () nr. C pages p.
Year: 2022
Contents:
Publisher: The Authors
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 41 found articles
 
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