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Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy |
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Title: |
Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy |
Author: |
Sakurai, Hiroshi Suzuki, Kosuke Ishii, Shoya Hoshi, Kazushi Nozawa, Takashi Ozaki, Hidetsugu Haga, Hiroto Tanigawa, Hiroyasu Someya, Yoji Tsuchiya, Masao Takeuchi, Hiroshi Tsuji, Naruki |
Appeared in: |
Nuclear materials and energy |
Paging: |
Volume 31 () nr. C pages p. |
Year: |
2022 |
Contents: |
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Publisher: |
The Authors |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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