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                                       Details for article 2 of 9 found articles
 
 
  Interface Trap State Characterization of Metal-Insulator-Semiconductor Structures Based on Photosensitive Organic Materials
 
 
Title: Interface Trap State Characterization of Metal-Insulator-Semiconductor Structures Based on Photosensitive Organic Materials
Author: Bezzeccheri, E.
Femia, A.
Liguori, R.
Rubino, A.
Appeared in: Materials today: proceedings
Paging: Volume 4 (2017) nr. 4PB pages 8 p.
Year: 2017
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 9 found articles
 
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